Flash announcement StressInside™ Emulator   To facilitate the mixed-signal SoC integration and succeed in the integration of logic and analog Virtual Components, modeling multiple rests-of-SoC and measuring the analog Virtual Component noise resilience is mandatory StressInside™ Features Programmable Virtual Component Easily migratable to any CMOS process Emulation of noise injection of multi synchronous logic rest of SoC Set of parameters to configure the rest of SoC Set of physical pads One logic programming interface Deliverables Specification Soft ViC User Manual for Design-In Integration guidelines in test board (worst topologic case)     Recommended Services Training on IDRT, StressInside Emulator Test chip specification, design Test chip characterization     Benefits Such purely logic ViC enables to emulate the disturbances of the synchronous rest-of-SoC logic in a low-area test chip including the sensitive analog Virtual Components and the StressInside Emulator. assess your ViC performance in a wide range of stressed environment using a single silicon thanks to StressInside Emulator programmability emits disturbance signals, either SoC specific or programmable, equivalent to the disturbances expectable at SoC level, to evaluate the capability of the analog ViC to reject such disturbances (ViC resilience) allows a true emulation of the SoC disturbances, and the ViC behavior facing those disturbances can be deeply studied.     StressInside™ Emulator Implementation StressInside Emulation Methodology Rest-of-SoC average activity reported in one clock period The StressInside configurable parameters at soft level are: number of power pads clock insertion delay technology process to establish the worst integration conditions The StressInside configurable parameters at hard level are: average number of commutations, dispersion, clock period, number of clock cycles     < Jazz Vision

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